Precision Test Solutions For Lab Research & Automated Test Applications

Femto 2000

Femto 2000

1.6 Gbps Precision Timing System

8-Channel, Precision Continuous Time Interval Analyzer (CTIA)

Through innovations in Continuous Time Interval Analyzer (CTIA) technology, the GuideTech Femto 2000 offers flexible, high-throughput, precision signal analysis capabilities to test high speed and timing critical devices from characterization to production test environments.

Filling the ATE Performance Gap

The Femto 2000 Multi-Site Time Instrument is a multi-channel Continuous Time Interval Analyzer (CTIA) designed to ‘fill the gap’ in ATE performance for high speed, precision timing measurements. Integration of the Femto 2000 with any ATE system extends the life of existing ATE or enhances the performance of new testers.

Ultra Fast High-Precision & Throughput Measurements

Advanced 2.3GHz bandwidth CTIA circuit design delivers up to one million direct timing measurements per second with 1ps resolution. Asynchronous parallel DSP architecture enables 1000-point measurements in less than 10ms on up to eight channels in parallel.

Minimize Switching, Simplify ATE Integration

Eight independent yet simultaneous measurement channels reduce channel switching on the test loadboard, dramatically improving test throughput and enabling multi-site parallel test. With the Femto 2000, it is easy to make mixed-signal measurements on any ATE system. The Femto 2000 comes with a C-language GPIB driver library for fast, easy integration into existing ATE test programs.

The Ideal Solution for Semiconductor ATE

Timing is everything in semiconductor manufacturing. The Femto 2000 is the ideal choice to enhance measurement capability and dramatically improve measurement speed and throughput in digital and mixed-signal test systems.

Product Specifications

General
Number of Channels: 2 to 8 (2 channels/Site)
Max Frequency: 800MHz
Max Data Rate: 1.6Gbps
Input Voltage Range: - 2V to + 2.5V
Max. Voltage Swing: 3V
Input Types: Single-ended or Differential (Factory Configured)
Input Impedance: 50 OHM
Threshold Resolution: 75 uV
Threshold Accuracy: 1mV
Input Sensitivity: 50mV
Dynamic Memory: 12MB DSP Memory per Site
Storage Memory: 20 GB Hard disk drive
Timebase
Internal Reference: NIST traceable precision oven oscillator
External Reference: 5MHz or 10MHz
User Interfaces
Front Panel Display: Windows NT GUI
ATE GPIB Interface: C-language function library
Arming Signals: Internal or External
Calibration
Built-in Calibration Self-cal, extended, NIST
Throughput
1000 measurements: < 10ms (on 8 channels)
Measurement
Measurement Rate: Up to 1 Million/Second
Measurement Resolution: 1ps (400fs hardware res.)
Jitter Noise Floor: <3ps
Jitter Accuracy: 2ps typical
Time Interval Accuracy: +/- 30ps (worst case across multiple channels)
Measurement Capabilities: Jitter test & separation
Period
Pulsewidth
Frequency
Frequency Modulation
PLL Loop Bandwidth
Time Interval
Risetime/Falltime
High/Low Voltage Levels
Functional Test at speed
And more…

Options
AMX 270Active Front-end MUX

  • 16 Channels
  • 32 Channels

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