Press Release

GUIDETECH FEMTO 2000 CTIA CERTIFIED ON
THE TERADYNE FLEX PLATFORM

Sunnyvale, CA – July 11, 2005 – GuideTech, the leading supplier of precision timing and jitter analysis solutions, announced that its Femto 2000™ Continuous Timing Interval Analyzer (CTIA) system has passed qualification as the first certified open architecture timing solution for Teradyne (R) FLEX(TM) automated test equipment (ATE) platform. Target applications for this integrated GuideTech and Teradyne solution, certified as part of the Teradyne OpenFLEX(TM) initiative, include testing of cost-sensitive consumer, network and automotive devices that require multiple channels of precision timing measurement on PLLs or non-deterministic source synchronous and serial interfaces up to 1.6Gbps.

“We see a growing number of customers get even more value out of their cost-efficient Teradyne FLEX ATE systems by integrating the precision timing capability of the GuideTech Femto 2000,” stated Tammy L. McClure, GuideTech VP Marketing. “Certification of the GuideTech Femto 2000 provides Teradyne with another tool for the fabless/subcon market where GuideTech has become the de facto standard with hundreds of systems installed in production to date. Fabless customers accustomed to the GuideTech CTIA at their subcon facilities will be happy to know that there are growing ATE options for testing their cost-sensitive consumer devices while still having access to the precision and throughput of the GuideTech Femto 2000. And as more Teradyne FLEX customers choose the certified GuideTech CTIAs for their precision timing needs, GuideTech will look to accelerate its deployment of CTIA solutions on the FLEX in the IDM market as well.

“The FLEX test platform with its OpenFLEX initiative provides a flexible open ATE platform that helps minimize overall cost of test by enabling full integration of third-party instruments like the GuideTech CTIA to meet special test requirements,” stated Sten Peeters, Teradyne OpenFLEX Product Manager. “With OpenFLEX Certified (TM), customers can have confidence that third-party instruments will easily integrate within the test environment and perform to requirements. The GuideTech CTIA solution can address the timing test challenges of devices that require a few high-performance channels while maintaining low cost of test on Teradyne FLEX systems.”

About the FLEX Test Platform and OpenFLEX
Teradyne FLEX Test Platform advances multiple technologies in a test architecture designed for high-efficiency, multi-site test. The Platform offers multiple systems so customers can optimize performance, capacity and capital cost to achieve lower cost-of-test for test requirements spanning DFT and structural test to standard analog and mixed-signal to the latest high-integration System-on-a-Chip (SOC) and System-In-Package (SIP) devices. The OpenFLEX open architecture initiative leverages the open system architecture of the FLEX platform. Launched in May 2002, it is the first such initiative within the ATE industry. OpenFLEX provides the commercial and technical infrastructure to facilitate the development and implementation of collaborative test solutions with customers and third party instrument suppliers. These focused instruments complement Teradyne FLEX instrument suite, enabling customers to further enhance system performance and test economics.

About Teradyne
Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment and interconnection systems. The company’s products deliver competitive advantage to the worlds leading semiconductor, electronics, automotive and network systems companies. In 2004, Teradyne had sales of $1.8 billion, and currently employs about 5900 people worldwide. For more information, visit www.teradyne.com. Teradyne, FLEX, OpenFLEX and OpenFLEX Certified are trademarks or registered trademarks of Teradyne, Inc.

About GuideTech
GuideTech is the leading innovator in high-performance timing measurement instruments, providing semiconductor manufacturers with the solution they need to minimize timing-related component failure and to dramatically reduce production test costs through test-time reduction and extended ATE lifecycles. Based on patented Continuous Time Interval Analyzer (CTIA) technology, the company's FEMTO family of multi-channel timing test systems accomplishes this by substantially improving test throughput via fast measurement rates, far greater accuracy, increased parallelism, and through critical, high-speed timing test coverage often lacking in ATE systems. Headquartered in Sunnyvale, CA, the company is the first to deliver cost-effective, advanced timing measurement solutions that easily integrate onto any ATE platform. For more information, please contact Tammy McClure at (408) 731-8857 or tammy@guidetech.com. Visit the company's Website at www.guidetech.com.