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Clock, VCO or PLL

Delay Buffer

CMOS Imaging Sensor

Cell Phone

Graphics or Monitor Controller

Digital TV Tuner

Optical Laser Driver (DVD, CD)

Datacom, SerDes Transceiver or similar

WiFi Wireless LAN

Hard Disk Controller

Power Management Controller

Opto-Isolator

Programmable Logic/Microcontroller

CPU Memory

Other (please indicate):

Design

Prototype

Pilot Production

High-volume Production

URGENT

Not urgent, but a solution is needed soon

Tolerable, but I am checking what my options are for insurance in case I need it later

Some signals on my device are too high for my current test system

The signal speed is:

The number of channels to test at this speed is:

My device has Differential Signals and I need:

Programmable termination

Flexibility to test Single-ended and Differential signals on the same pins

The number of Differential channels to test is:

My device has asynchronous signals that my tester has difficulty handling

PLL

LVDS

DVI/TMDS or similar

PCI Express, XAUI or similar

Fibre Channel, Serial-ATA or similar

Other:

My tester needs better timing precision for AC measurements

Frequency

Spread Spectrum Modulation or similar

PLL Lock Time

ClockPeriodorDutyCycle

Rise/Fall Times

Channel-to-Channel Skew (Clock-to-Data, Clock-to-Clock, Data-to-Data)

Differential Crossing Voltage and Skew

Serial Interface Test

PRBS or other Test Pattern Verification: (if other, what patterns?)

Random Jitter

Periodic Jitter

Data Dependant Deterministic Jitter

Total Jitter

Data Eye Opening

I need faster test time throughput for testing AC parameters in production than the instrument I use today:

(name of instrument)

I would like a PMU for DC measurements on each channel so I don't have to switch to a digital pin PMU

I need to add a few channels of high-speed digital pattern generation to my low-end ATE

I have no test issues now, but I anticipate a need for a precision test solution for my future devices

What I need is not mentioned above. I need:

Agilent Model:
Teradyne Model:
NexTest Model:
Credence Model:
LTX Model:
Advantest Model:
Roos Model:
KVD Model:
Eagle Model:
"Home-brew" In-house tester:
Other ATE: