Precision Test Solutions For Lab Research & Automated Test Applications

Technical Whitepapers

    • GuideTech CTIA Technology & Applications Presentation

 

 

    • ITC 2004 – Jitter Models and Measurement Methods for High-Speed Serial Interconnects.

 

 

    • ITC 2004 – Jitter Generation and Measurement for Test of Multi-Gbps Serial I/O.

 

 

    • 1st Annual TTTC Gigabit Test Workshop, Oct 2004 – GuideTech Keynote Speech

 

 

    • 1st Annual TTTC Gigabit Test Workshop, Oct 2004 – Bounded uncorrelated jitter
      (BUJ) characterization platform for high-speed interconnects

 

 

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