- Teradyne J750 and GuideTech TIA for Production Test
– Business Wire - A High-Throughput Jitter Analysis Test Strategy
– Evaluation Engineering - Timing Analyzer Handles High-Speed Interfaces
– Test & Measurement World - GuideTech Breaks Jitter Test Cost Barrier With New GT4000 CTIA
– Test and Measurement.com - Taking The Fear Out Of The Jitter Bug
– Electronic Design - Semicon West Wrap-Up
– Test & Measurement World - Integrated CTIA Measurement Solution (EXA 3000 – NPTest)
- Jitter Testing in Production (GuideTech and Credence Systems)
- Precision Jitter and Timing Tests in Milliseconds, in Parallel
- GT658 as a tool for studying single-molecule dynamics