1.6 Gbps Precision Timing System
8-Channel, Precision Continuous Time Interval Analyzer (CTIA)
Through innovations in Continuous Time Interval Analyzer (CTIA) technology, the GuideTech Femto 2000 offers flexible, high-throughput, precision signal analysis capabilities to test high speed and timing critical devices from characterization to production test environments.
Filling the ATE Performance Gap
The Femto 2000 Multi-Site Time Instrument is a multi-channel Continuous Time Interval Analyzer (CTIA) designed to ‘fill the gap’ in ATE performance for high speed, precision timing measurements. Integration of the Femto 2000 with any ATE system extends the life of existing ATE or enhances the performance of new testers.
Ultra Fast High-Precision & Throughput Measurements
Advanced 2.3GHz bandwidth CTIA circuit design delivers up to one million direct timing measurements per second with 1ps resolution. Asynchronous parallel DSP architecture enables 1000-point measurements in less than 10ms on up to eight channels in parallel.
Minimize Switching, Simplify ATE Integration
Eight independent yet simultaneous measurement channels reduce channel switching on the test loadboard, dramatically improving test throughput and enabling multi-site parallel test. With the Femto 2000, it is easy to make mixed-signal measurements on any ATE system. The Femto 2000 comes with a C-language GPIB driver library for fast, easy integration into existing ATE test programs.
The Ideal Solution for Semiconductor ATE
Timing is everything in semiconductor manufacturing. The Femto 2000 is the ideal choice to enhance measurement capability and dramatically improve measurement speed and throughput in digital and mixed-signal test systems.
AMX 270 Active Front-end MUX
|Number of Channels||2 to 8 (2 channels/Site)|
|Max Data Rate||1.6Gbps|
|Input Voltage Range||- 2V to + 2.5V|
|Max. Voltage Swing||3V|
|Input Types||Single-ended or Differential (Factory Configured)|
|Input Impedance||50 OHM|
|Threshold Resolution||75 uV|
|Dynamic Memory||12MB DSP Memory per Site|
|Storage Memory||20 GB Hard disk drive|
|Internal Reference||NIST traceable precision oven oscillator|
|External Reference||5MHz or 10MHz|
|Front Panel Display||Windows NT GUI|
|ATE GPIB Interface||C-language function library|
|Arming Signals||Internal or External|
|Built-in Calibration||Self-cal, extended, NIST|
|1000 measurements||< 10ms (on 8 channels)|
|Measurement Rate||Up to 1 Million/Second|
|Measurement Resolution||1ps (400fs hardware res.)|
|Jitter Noise Floor||<3ps|
|Jitter Accuracy||2ps typical|
|Time Interval Accuracy||+/- 30ps (worst case across multiple channels)|
|Measurement Capabilities||Jitter test & separation
PLL Loop Bandwidth
High/Low Voltage Levels
Functional Test at speed
- 16 Channels
- 32 Channels