Articles and News Coverage
- Teradyne J750 and GuideTech TIA for Production Test -- Business Wire
- A High-Throughput Jitter Analysis Test Strategy – Evaluation Engineering
- Timing Analyzer Handles High-Speed Interfaces - Test & Measurement World
- GuideTech Breaks Jitter Test Cost Barrier With New GT4000 CTIA – Test and Measurement.com
- Taking The Fear Out Of The Jitter Bug - Electronic Design
- New Products – Semiconductor International – 09/15/2004
- Semicon West Wrap-Up – Test & Measurement World
- Integrated CTIA Measurement Solution (EXA 3000 – NPTest)
- Jitter Testing in Production (GuideTech and Credence Systems)
- Precision Jitter and Timing Tests in Milliseconds, in Parallel
- GT658 as a tool for studying single-molecule dynamics
